Validating pre post test dating itv
FPGA-based emulators, a well-established part of most implementation techniques, are faster than software simulators but will not deliver the comprehensive at-system-speed tests needed for device reliability.Moreover, the problem of post-silicon validation is getting worse, as design complexity increases because of the terrific advances in semiconductor materials processing.Let's say, for example, a university professor wants to gather information on whether, and, if so, how the thinking of students change due to taking her Race, Ethnicity and Identity class.By collecting pre-test data on her students' attitudes at the beginning of the course and post-test data on their attitudes after the course she'll be able to measure any change in students' attitudes.Large semiconductor companies spend millions creating new components; these are the "sunk costs" of design implementation.Consequently, it is imperative that the new chip function in full and perfect compliance to its specification, and be delivered to the market within tight consumer windows.
While in the past most of this effort was dedicated to validating electrical aspects of the design, or diagnosing systematic manufacturing defects, today a growing portion of the effort focuses on functional system validation.
The basic set up for a Pre and Post Test Survey is pictured below.
Respondents will start their response in a gateway survey that is used to create a unique identifier for each respondent.
This trend is for the most part due to the increasing complexity of digital systems, which limits the verification coverage provided by traditional pre-silicon methodologies.
As a result, a number of functional bugs survive into manufactured silicon, and it is the job of post-silicon validation to detect and diagnose them so that they do not escape into the released system.The bugs in this category are often system-level bugs and rare corner-case situations buried deep in the design state space: since these problems encompass many design modules, they are difficult to identify with pre-silicon tools, characterized by limited scalability and performance.